JPK NanoWizard II - Atomic Force Microscope by Bruker

Manufacturer's User Manual PDF

The JPK NanoWizard II Atomic Force Microscope (Bruker) is designed for high-resolution imaging and surface characterization at the nanoscale. It operates by scanning a sharp probe across the sample surface to detect variations in topography and material properties. The instrument measures the interaction forces between the probe tip and the sample with nanometer precision, enabling the visualization of surface structures and mechanical features under ambient, liquid, or controlled environmental conditions.